Magnetization reversal mechanism in CoCr media for perpendicular recording
- 1 September 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 23 (5) , 2260-2262
- https://doi.org/10.1109/tmag.1987.1065647
Abstract
It has recently been shown [1] that hysteresis loss as a ftulction of the direction of the applied field can be used as a criteria to determine the reversal mechanism in CoCr films. In this paper we present hysteresis loss ( ) and orientation ratio (OR) as function of the amplitude and direction of the applied field for low and high sputtered CoCr films. The reversal behaviour depends strongly on the amplitude and direction of the field. The presence of all initial layer has an important influence on the type of reversal. The rotational mechanism governs the switching in high films while the domain-wall reversal acts in the low coercivity film.Keywords
This publication has 4 references indexed in Scilit:
- TEM Observation of Segregated Microstructure in Sputtered Co–Cr FilmJapanese Journal of Applied Physics, 1986
- Reversal Mechanism in Perpendicular Media with Columnar MicrostructurePhysica Status Solidi (a), 1986
- Perpendicular magnetic recordingIEEE Transactions on Magnetics, 1980
- A mechanism of magnetic hysteresis in heterogeneous alloysPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1948