TEM Observation of Segregated Microstructure in Sputtered Co–Cr Film
- 1 August 1986
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 25 (8A) , L668-670
- https://doi.org/10.1143/jjap.25.l668
Abstract
TEM observation of the segregated microstructure in sputtered Co–Cr films was conducted. The specific segregated microstructure was observed in the film composition range of 15.3–24.3 at%Cr–Co. The results present a new model for the origin of the segregation where two-phase separation into magnetic and non-magnetic phases occurs in a single hcp phase. The ferromagnetic Co-rich regions in a crystallite are supposed to be embedded in nonmagnetic Cr-rich matrix, with a wall-like figure perpendicular to the substrate plane.Keywords
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