Imaging spectroscopy with the atomic force microscope
- 1 July 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 76 (1) , 33-38
- https://doi.org/10.1063/1.357150
Abstract
Force curve imaging spectroscopy involves acquiring a force–distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip‐sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images.This publication has 23 references indexed in Scilit:
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