Optical interferometry for measuring instantaneous thickness of transparent solid and liquid films
- 1 September 1988
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 59 (9) , 2018-2022
- https://doi.org/10.1063/1.1140018
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Optical method for measuring uniform thickness of the order of 10 μm–1 mm of transparent solid and liquid filmsReview of Scientific Instruments, 1987
- A new ellipsometric method for measurements on surfaces and surface layersMaterials Science and Engineering, 1980