EXELFS analysis of amorphous and crystalline silicon carbide

Publisher Website

1 April 1991

journal article
Published by Wiley in Journal of Microscopy

Vol. 162 (1) , 171-178
https://doi.org/10.1111/j.1365-2818.1991.tb03127.x

Abstract

No abstract available

Keywords

This publication has 4 references indexed in Scilit:

Operation modes of electron spectroscopic imaging and electron energy-loss spectroscopy in a transmission electron microscope
Ultramicroscopy, 1988
Near-edge fine-structure analysis of core-shell electronic absorption edges in silicon and its refractory compounds with the use of electron-energy-loss microspectroscopy
Journal of Applied Physics, 1987
Analysis of Si-K edge EXAFS in the low k domain
Journal de Physique, 1986
Irond-band occupancy in amorphous ${Fe}_{x}$ ${Ge}_{1 - x}$
Physical Review B, 1985