Direct determination of the semichannel focusing energy from the ion reflection data

1 January 1982

journal article
research article
Published by Taylor & Francis in Radiation Effects

Vol. 62 (1-2) , 107-109
https://doi.org/10.1080/00337578208235415

Abstract

The semichannel focusing energy in the case of Ar ions and ⟨110⟩ semichannel on the (100) Cu face has been found from the ion reflection data to be 0.59±0.14 keV.

Keywords

DIRECT DETERMINATION
SEMICHANNEL FOCUSING
FOCUSING ENERGY
ION REFLECTION
REFLECTION DATA

This publication has 4 references indexed in Scilit:

Trajectory focusing in surface scattering and the analysis of surface structure
Radiation Effects, 1978
Ion beam focusing by the atomic chains of a crystal lattice
Radiation Effects, 1975
Low-energy ion reflection from metal surfaces
Surface Science, 1974
Medium-energy ion scattering by solid surfaces part II
Radiation Effects, 1974