Instantaneous measurement of the intensity distribution of a focused high power laser pulse
- 1 January 1982
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 17 (1) , 21-27
- https://doi.org/10.1051/rphysap:0198200170102100
Abstract
A digitalized TV system controlled by a microprocessor allows the focused intensity distribution of laser pulses to be determined instantaneously. The use of silicon mosaic vidicons at 1.06 μm is discussed and their performance is compared with that obtained using photographic methods. The linearity response of the vidicon is very good provided a preillumination system is used. Dynamic ranges of 64, and 255 x 255 pixels are analysed. This system allows the minimum cross-section Smin of the focused laser intensity distribution to be measured five seconds after each laser shot, with an accuracy of ± 4 % for absolute values, and ± 2 % for relative variations of Smin . The usefulness of this system is amply demonstrated in a graphical plot of the variation in the number of ions formed, as a function of laser intensity for the four-photon ionization of Cs atomsKeywords
This publication has 4 references indexed in Scilit:
- Continuous frequency scanning of a stabilized single-mode Q-switched Nd^3+: glass laserApplied Optics, 1979
- Silicon vidicon system for measuring laser intensity profilesApplied Optics, 1978
- Tunable-wavelength mode-locked Nd-glass laser with instant recording of temporal and spectral parametersJournal of Applied Physics, 1977
- Multiphoton Ionization of Rare Gases at Very High Laser Intensity (W/) by a 30-psec Laser Pulse at 1.06 μmPhysical Review Letters, 1976