Suppression of geometric component of charge-pumping current in SOI/MOSFETs
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 144-148
- https://doi.org/10.1109/vtsa.1995.524651
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- On the geometric component of charge-pumping current in MOSFETsIEEE Electron Device Letters, 1993
- A reliable approach to charge-pumping measurements in MOS transistorsIEEE Transactions on Electron Devices, 1984