A demountable vacuum system for secondary emission studies
- 1 June 1955
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 32 (6) , 221-223
- https://doi.org/10.1088/0950-7671/32/6/305
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- The sources of electron-induced contamination in kinetic vacuum systemsBritish Journal of Applied Physics, 1954
- The origin of specimen contamination in the electron microscopeBritish Journal of Applied Physics, 1953
- Demountable vacuum sealsJournal of Scientific Instruments, 1952
- Silicone Oil Vapour and Secondary Electron EmissionNature, 1951
- Application of the mass spectrometer to high vacuum problemsJournal of Scientific Instruments, 1951