Efficient calculation of ionization coefficients in silicon from the energy distribution function
- 1 August 1990
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 68 (3) , 1075-1081
- https://doi.org/10.1063/1.346747
Abstract
A method for calculating impact ionization coefficients by solving the Boltzmann transport equation is presented. The distribution function is taken to be expressible as a Legendre polynomial expansion, which is substituted into a Boltzmann equation that incorporates the effects of nonparabolic band structure, deformation-potential phonon scattering, and impact ionization. The resulting Boltzmann equation can be expressed in a linear form, and solved using sparse-matrix difference-differential methods. Ionization coefficients are obtained directly from the distribution function. Calculated values for the ionization coefficients agree very well with experiment for electrons in silicon.This publication has 11 references indexed in Scilit:
- Impact ionization coefficient and energy distribution function at high fields in semiconductorsJournal of Applied Physics, 1989
- Electron energy distribution for calculation of gate leakage current in MOSFETsSolid-State Electronics, 1988
- A lucky drift model, including a soft threshold energy, fitted to experimental measurements of ionization coefficientsSolid-State Electronics, 1987
- The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materialsReviews of Modern Physics, 1983
- Aspects of the Theory of Impact Ionization in Semiconductors (I)Physica Status Solidi (b), 1980
- Threshold Energies for Electron-Hole Pair Production by Impact Ionization in SemiconductorsPhysical Review B, 1972
- High-Field Transport in- Type GaAsPhysical Review B, 1968
- Ionization Rates of Holes and Electrons in SiliconPhysical Review B, 1964
- Maximum Anisotropy Approximation for Calculating Electron Distributions; Application to High Field Transport in SemiconductorsPhysical Review B, 1964
- Transport and Deformation-Potential Theory for Many-Valley Semiconductors with Anisotropic ScatteringPhysical Review B, 1956