Characterization of FeMn(N)/FeMn/Permalloy exchange coupled structures
- 15 November 1988
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 64 (10) , 6118-6120
- https://doi.org/10.1063/1.342111
Abstract
X-ray diffraction was used to investigate the effect of nitrogen additions on the crystal structure and preferred orientation of FeMn films reactively sputtered in an Ar-N2 ambient. The fcc γ-FeMn phase was stabilized over a range of nitrogen pressures. The fcc FeMn(N) film was then used as a nucleation substrate for the deposition of an FeMn/Permalloy exchange coupled structure. A maximum exchange bias of 60–70 Oe was obtained when the FeMn(N) film was lattice matched to the γ-FeMn structure (a0=3.63 Å).This publication has 3 references indexed in Scilit:
- Exchange induced unidirectional anisotropy at FeMn-Ni80Fe20 interfacesJournal of Applied Physics, 1981
- A Minicomputer and Methodology for X-Ray AnalysisAdvances in X-ray Analysis, 1979
- Chemisorption of N2 on an Fe(100) surfaceJournal of Vacuum Science and Technology, 1976