A Minicomputer and Methodology for X-Ray Analysis
- 1 January 1979
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 23, 313-316
- https://doi.org/10.1154/s0376030800006455
Abstract
This paper outlines the use of an IBM Series/1 small computer for instrument automation and data reduction for X-ray polycrystalline diffractometry and wavelength dispersive X-ray fluorescence spectrometry. The profile fitting method is used to determine 2θ, d and relative peak and integrated intensities in diffraction, and the fundamental parameters method (LAMA program) is used for quantitative analysis of bulk and thin film samples. The methods are precise and rapid.Keywords
This publication has 4 references indexed in Scilit:
- High-speed X-ray analysisJournal of Applied Crystallography, 1978
- Qualitative Analysis of Complicated Mixtures by Profile Fitting X-Ray Diffractometer PatternsPublished by Springer Nature ,1978
- Simultaneous determination of composition and mass thickness of thin films by quantitative x-ray fluorescence analysisAnalytical Chemistry, 1977
- Lama I - A General Fortrah Program for Quantitative X-ray Fluorescence AnalysisAdvances in X-ray Analysis, 1976