Coupled interface plasmons of the Ag-Si(111) system as investigated with high-resolution electron energy-loss spectroscopy
- 3 March 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 168 (1-3) , 142-148
- https://doi.org/10.1016/0039-6028(86)90844-7
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- Investigation of electronic properties of semiconductor interfaces and layer systems by electron energy-loss spectroscopySurface Science, 1986
- Dispersion of the dangling-bond surface states of Si(111)-(7×7)Physical Review B, 1984
- Inelastic scattering of slow electrons from Si(111) surfacesPhysical Review B, 1984
- Inelastic scattering of electrons from ionic crystals with a highly conducting overlayerPhysical Review B, 1984
- -7 × 7 systems investigated by angle resolved electron energy loss spectroscopySurface Science, 1984
- Low energy electronic and vibronic excitations of semiconductor surfacesSurface Science, 1983
- Electronic and crystallographic structures of silver adsorbed on silicon (111)Journal de Physique Lettres, 1978
- Coupled Interface Plasmons of Al Films on CdSe and CdSPhysical Review Letters, 1977
- Optical Properties of SemiconductorsPhysical Review B, 1963
- Optical Properties of Ag and CuPhysical Review B, 1962