Coupled Interface Plasmons of Al Films on CdSe and CdS
- 31 January 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 38 (5) , 245-248
- https://doi.org/10.1103/physrevlett.38.245
Abstract
Coupled plasmon modes have been observed at interfaces of thin (3-100-Å) Al films with CdSe and CdS by low-energy electron energy-loss spectroscopy. The spectral features and their dependence on film thickness demonstrate that chemically reacted layers form at the metal-semiconductor junctions with frequency-dependent dielectric constants which are significantly different from their semiconductor counterparts.This publication has 16 references indexed in Scilit:
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