Comprehensive study of time-lapsed peak shift in InGaN quantum well structures: Discrimination of localization effect from internal field effect
- 29 January 2007
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 90 (5)
- https://doi.org/10.1063/1.2437680
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- High-power and wide wavelength range GaN-based laser diodesPublished by SPIE-Intl Soc Optical Eng ,2006
- Confocal microphotoluminescence of InGaN-based light-emitting diodesJournal of Applied Physics, 2005
- Optically pumped lasing and gain formation properties in blue Inx Ga1–x N MQWsPhysica Status Solidi (b), 2004
- Microstructure and electronic properties of InGaN alloysPhysica Status Solidi (b), 2003
- Carrier loss and luminescence degradation in green-light-emitting InGaN quantum wells with micron-scale indium clustersApplied Physics Letters, 2003
- Estimation of Device Properties in AlGaInN-Based Laser Diodes by Time-Resolved PhotoluminescencePhysica Status Solidi (a), 2001
- Localized excitons in an In0.06Ga0.94N multiple-quantum-well laser diode lased at 400 nmApplied Physics Letters, 2001
- Dimensionality of excitons in laser-diode structures composed ofmultiple quantum wellsPhysical Review B, 1999
- Reduction of oscillator strength due to piezoelectric fields in quantum wellsPhysical Review B, 1998