Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 keV x rays and electrons
- 1 December 1992
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 72 (11) , 5429-5436
- https://doi.org/10.1063/1.351984
Abstract
A model for electron transport and emission in CsI is proposed. It is based on theoretically calculated microscopic cross sections for electron interaction with the nuclear and the electronic components of the solid. A Monte Carlo program based on this model was developed to simulate secondary electron emission induced by x rays and electrons in the energy range of 1 to 10 keV. The calculated secondary emission yields agree with existing experimental data. The model provides all necessary characteristics for the design of radiation detectors based on secondary electron emission. It can be expanded to higher incident energies and other alkali halides.This publication has 29 references indexed in Scilit:
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