Specimen Fracturing Device for Ion Microprobe Mass Analyzer and its Application to the Analysis of Grain Boundary Segregation
- 1 January 1977
- journal article
- Published by Japan Institute of Metals in Transactions of the Japan Institute of Metals
- Vol. 18 (1) , 61-65
- https://doi.org/10.2320/matertrans1960.18.61
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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- Direct evidence for boron segregation to grain boundaries in a nickel-base alloy by secondary ion mass spectrometryMetallurgical Transactions A, 1975
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- Ion Microprobe Mass Analysis for Iron and Steel ResearchJapanese Journal of Applied Physics, 1974
- In-Depth Analysis in Selected Area with Ion Microprobe AnalyzerJapanese Journal of Applied Physics, 1974
- Ion Microprobe Analyzer with Wien Filter for Primary Ion Mass SeparationJournal of the Mass Spectrometry Society of Japan, 1974
- Ion Microprobe Mass Analyzer Equipped with Specific Devices for Iron and Steel ResearchSHINKU, 1974
- A Study of Temper Brittleness of Tin Doped Steels by Auger Electron-Spectroscopic MethodTransactions of the Iron and Steel Institute of Japan, 1972
- Ion Microprobe Mass AnalyzerJournal of Applied Physics, 1967