Millimeter-wave deembedding using the extended TRL (ETRL) approach

Abstract
A novel approach for deembedding is presented which utilizes known physical transmission line lengths instead of electrical characteristics for calibration standards. This allows one to perform millimeter-wave deembedding for waveguide-based vector network analyzers. Theoretical formulation of ETRL and experimental characterization for V-band microstrip lines are shown. Important design guidelines, and selection of valid root choice of the formulation are described.

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