Microwave Measurement of Semiconductor Carrier Lifetimes
- 1 May 1960
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 31 (5) , 938-939
- https://doi.org/10.1063/1.1735726
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Microwave Techniques in Measurement of Lifetime in GermaniumJournal of Applied Physics, 1959
- Transient Recombination of Excess Carriers in SemiconductorsPhysical Review B, 1958
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952
- Electron-Hole Recombination in GermaniumPhysical Review B, 1952