Der Einfluß der inhomogenen Verteilung der Rekombinationszentren auf das Inversionsverhalten von MOS-Kondensatoren
- 16 February 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 21 (2) , 693-702
- https://doi.org/10.1002/pssa.2210210235
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- On the Determination of Minority Carrier Lifetime and Surface Recombination Velocity from the Transient Response of MOS CapacitorsJapanese Journal of Applied Physics, 1972
- On the separation of bulk and surface components of lifetime using the pulsed MOS capacitorSolid-State Electronics, 1970
- Bulk lifetime determination using an MOS capacitorProceedings of the IEEE, 1970
- Measuring the lifetime of minority carriers in MIS structuresSolid-State Electronics, 1969
- On the determination of minority carrier lifetime from the transient response of an MOS capacitorIEEE Transactions on Electron Devices, 1967
- Minority carrier lifetime determination from inversion layer transient responseIEEE Transactions on Electron Devices, 1967
- Surface effects on p-n junctions: Characteristics of surface space-charge regions under non-equilibrium conditionsSolid-State Electronics, 1966