4.5 kV GTO turn-off failure analysis under an inductive load including snubber, gate circuit and various parasitics

Publisher Website

25 August 2005

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/ispsd.1992.991246

Abstract

No abstract available

This publication has 4 references indexed in Scilit:

Simulation of wafer-scale GTO thyristors in circuits
IEEE Transactions on Power Electronics, 1991
A study on GTO turn-off failure mechanism—A time- and temperature-dependent 1-D model analysis
IEEE Transactions on Electron Devices, 1984
One-dimensional analysis of turnoff phenomena for a gate turnoff thyristor
IEEE Transactions on Electron Devices, 1979
Gate turn-off in p-n-p-n devices
IEEE Transactions on Electron Devices, 1966