An in situ cell for characterization of solids by soft x-ray absorption
- 20 September 2004
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 75 (10) , 3242-3247
- https://doi.org/10.1063/1.1791320
Abstract
A cell has been designed and fabricated for in situ characterization of catalysts and environmental materials using soft x-ray absorption spectroscopy and spectromicroscopy at photon energies above . “Lab-on-a-chip” technologies were used to fabricate the cell on a glass wafer. The sample compartment is in diameter and has a gas path length of to minimize x-ray absorption in the gas phase. The sample compartment can be heated to by an resistive heater and gas flows up to can be supplied to the sample compartment through microchannels. The performance of the cell was tested by acquiring -edge x-ray appearance near-edge structure (XANES) data during the reduction and oxidation of a silica-supported catalyst using the beam line 11.0.2 scanning transmission x-ray microscope (STXM) at the Advanced Light Source of Lawrence Berkeley National Laboratory (Berkeley, CA). Two-dimensional images of individual catalyst particles were recorded at photon energies between 926 and , the energy range in which the and absorption edges are observed. Oxidation state specific images of the catalyst clearly show the disappearance of species during the exposure of the oxidized sample to 4% in while increasing the temperature from 308 to . Reoxidation restores the intensity of the image associated with . -edge XANES spectra obtained from stacks of STXM images show that with increasing temperature the peak intensity decreases as the peak intensity increases.
Keywords
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