Optical ellipsometry and electron spectroscopy studies of copper oxidation related to copper on printed circuit boards
- 1 January 1992
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (1) , 32-38
- https://doi.org/10.1002/sia.740180106
Abstract
No abstract availableKeywords
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- Choice of criteria for ellipsometric determinations on thin filmsThin Solid Films, 1972
- Optical Properties of Copper Oxide FilmsJournal of Applied Physics, 1966