Instrumentation and analog implementation of the Q-C method for MOS measurements
- 30 November 1984
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 27 (11) , 953-962
- https://doi.org/10.1016/0038-1101(84)90069-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Digital implementation of the Q-C method for MOS measurementsSolid-State Electronics, 1984
- Improved MOS capacitor measurements using the Q-C methodSolid-State Electronics, 1984
- Capacitance Transient Spectroscopy of Trace Contamination in SiliconJournal of the Electrochemical Society, 1982