Specimen coating for high resolution scanning electron microscopy
- 1 January 1981
- Vol. 4 (4) , 169-174
- https://doi.org/10.1002/sca.4950040402
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Ion etching for pattern delineationJournal of Vacuum Science and Technology, 1976
- Ion bombardment of suitable targets for atomic shadowing for high resolution electron microscopyMicron (1969), 1974
- A saddle field ion source of spherical configuration for etching and thinning applicationsVacuum, 1974