A Polarization Modulation Infrared Reflection Technique Applied to Study of Thin Films on Metal and Semiconductor Surfaces
- 23 December 1985
- journal article
- Published by Springer Nature in Analytical Sciences
- Vol. 1 (5) , 403-408
- https://doi.org/10.2116/analsci.1.403
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Metastable surface species on MoO3 observed in methanol vapor at an elevated temperature with polarization modulation infrared spectroscopyApplications of Surface Science, 1984
- Multiple adsorbates on copper surfaces in formic acid vapor observed by polarization modulation infrared spectroscopyThe Journal of Physical Chemistry, 1983
- THE MEASUREMENT OF INFRAREL REFLECTION-ABSORPTION SPECTRA OF THIN POLYVINYLACETATE FILMS FORMED ON SILICON SURFACESChemistry Letters, 1983
- Polarization-modulated attenuated total-internal reflection infrared spectroscopic study of surfaces: An application to the aging of oxide films on silicon platesThe Journal of Physical Chemistry, 1983
- A method for measuring infrared reflection?Absorption spectra of molecules adsorbed on low-area surfaces at monolayer and submonolayer concentrationsJournal of Catalysis, 1981
- Identification of adsorbed species at metal surfaces by electron energy loss spectroscopy (EELS)Applied Physics A, 1981
- Infrared spectra of 14NO and 15NO on a low-area Pt surface at elevated temperaturesJournal of Catalysis, 1980
- The infrared spectrum of adsorbed carbon monoxide on a platinum surface in the presence of high pressure gas-phase carbon monoxideThe Journal of Physical Chemistry, 1978
- Analysis of surface reactions by spectroscopy of surface vibrationsApplications of Surface Science, 1977
- Activities of Urease and Pepsin MonolayersJournal of the American Chemical Society, 1938