Thermally activated flux movement and critical transport current density in epitaxial films
- 1 May 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 49 (18) , 13184-13192
- https://doi.org/10.1103/physrevb.49.13184
Abstract
In this article we report on thermally excited flux creep and the critical transport current density in high-quality epitaxial thin films. Both dissipative mechanisms are governed by the highly anisotropic behavior of this compound which was investigated by means of the angular dependence of the magnetoresistivity (γ≥150). The activation energy U for thermally excited flux creep was evaluated with respect to temperature, magnetic field, and applied current density j. U(T,B,j) is essentially increasing linearly with falling temperature, power-law dependent on the field (U∝ with α≊0.5), and almost independent of current density for j≤ A/. These experimental results are consistent with the concept of plastic flux creep. The critical current density exhibits high absolute values [(77 K, B=0)=4× A/] and was measured for magnetic fields in the configuration B∥c up to 10 T and also with respect to various Θ angles between the c axis and field direction. The decrease of with increasing B was found to be significantly reduced in comparison to single crystals and prior results on thin films. A further enhancement in the (B,T) behavior could not be achieved by chemical doping through partial substitution of copper by zinc.
Keywords
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