Point contact pseudo-metal/oxide/semiconductor transistor in as-grown silicon on insulator wafers
- 1 January 1992
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 12 (1-2) , 191-194
- https://doi.org/10.1016/0921-5107(92)90284-g
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Electron trapping in irradiated SIMOX buried oxidesIEEE Electron Device Letters, 1991
- Optimization of SIMOX for VLSI by electrical characterizationIEEE Transactions on Electron Devices, 1991
- New method for the extraction of MOSFET parametersElectronics Letters, 1988