Dielectric impurities and surface instability in Langmuir probe plasma measurements
- 1 July 1974
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 7 (10) , 1391-1401
- https://doi.org/10.1088/0022-3727/7/10/312
Abstract
Dielectric impurities on Langmuir probes are shown to be a source of surface instability in plasma measurements. The probe workfunction becomes current-dependent due apparently to electrostatic charging rendering the probe characteristic to become distorted. This instability can also give rise to the related phenomena of current hysteresis.Keywords
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