Nature of the 1/f noise in 6H-SiC

• 2 November 1994
• journal article
• Published by IOP Publishing in Semiconductor Science and Technology
• Vol. 9  (11) , 2080-2084
• https://doi.org/10.1088/0268-1242/9/11/008

Abstract

Keywords

• LOW FREQUENCY NOISE
• NOISE MEASUREMENT
• DENSITY OF STATE
• DENSITY DEPENDENCE