Nuclei of dark spots in organic EL devices: detection by DFM and observation of the microstructure by TEM
- 1 December 1997
- journal article
- Published by Elsevier in Synthetic Metals
- Vol. 91 (1-3) , 113-116
- https://doi.org/10.1016/s0379-6779(97)03989-1
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Electromigration of aluminum cathodes in polymer-based electroluminescent devicesApplied Physics Letters, 1996
- Formation and growth of black spots in organic light-emitting diodesJournal of Applied Physics, 1996
- Organic electroluminescent devices with improved stabilityApplied Physics Letters, 1996
- Organic Electroluminescent DevicesScience, 1996
- Growth of dark spots by interdiffusion across organic layers in organic electroluminescent devicesApplied Physics Letters, 1996
- Degradation and failure of MEH-PPV light-emitting diodesJournal of Applied Physics, 1996
- Morphological change in the degradation of Al electrode surfaces of electroluminescent devices by fluorescence microscopy and AFMThin Solid Films, 1996
- Reliability and degradation of organic light emitting devicesApplied Physics Letters, 1994
- Organic Electroluminescent Device with a Three-Layer StructureJapanese Journal of Applied Physics, 1988
- Organic electroluminescent diodesApplied Physics Letters, 1987