Local second harmonic generation intensity mapping using a NSOM with an uncoated fiber tip
- 23 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 251-252
- https://doi.org/10.1109/leos.1996.565223
Abstract
Most near-field optical experiments are performed with fiber tips coated with an opaque metal layer. The resolution of such experiments is determined by the aperture size and is typically equal to 50 nm. Here we report the first experiment to implement near-field scanning optical microscopy (NSOM) with an uncoated fiber tip to map local SHG intensity from a KDP crystal surface.This publication has 3 references indexed in Scilit:
- Near-field direct-write ultraviolet lithography and shear force microscopic studies of the lithographic processApplied Physics Letters, 1995
- Characterization of phase-conjugated near-field light spotsJournal of the Optical Society of America B, 1995
- Phase conjugation of an optical near fieldOptics Letters, 1994