The origins of the secondary electron signal in scanning electron microscopy
- 1 November 1974
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 7 (16) , 2169-2173
- https://doi.org/10.1088/0022-3727/7/16/304
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Multiple scattering of 5 - 30 keV electrons in evaporated metal films III: Backscattering and absorptionBritish Journal of Applied Physics, 1965
- High resolution scanning electron microscopyJournal of Scientific Instruments, 1965
- Über Rückdiffusion und Sekundärstrahlung mittelschneller Kathodenstrahlen an MetallenAnnalen der Physik, 1928
- Über die Geschwindigkeit der sekundären KathodenstrahlungAnnalen der Physik, 1925