Numerical Simulation of SEU Induced Latch-Up

1 January 1986

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 33 (6) , 1565-1570
https://doi.org/10.1109/TNS.1986.4334642

Abstract

The PISCES-II device analysis program has been modified to perform two-dimensional SEU induced latch-up simulations. The results of the simulations have been compared to cyclotron test data taken on a custom test chip. The comparison indicates that the simulations are accurate for light ions. A description of the latch-up process is also given.

Keywords

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