In Situ Measurement of Bridging Stresses in Toughened Silicon Nitride Using Raman Microprobe Spectroscopy
- 1 May 1999
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 82 (5) , 1249-1256
- https://doi.org/10.1111/j.1151-2916.1999.tb01903.x
Abstract
No abstract availableKeywords
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