Efficient generation of test patterns using Boolean difference
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 795-801
- https://doi.org/10.1109/test.1989.82368
Abstract
Most automatic test pattern generation systems for combinational circuits generate a test for a given fault by directly searching a data structure representing the circuit to be tested. The author describes a novel system that divides the problem into two parts: first it constructs a formula expressing the Boolean difference between the unfaulted and faulted circuits. Second, it applies a Boolean satisfiability algorithm to the resulting formula. The novel system can incorporate any of the heuristics used by structural search techniques. It is not only quite general but is able to test or improve untestable every fault in the popular Brglez-Fujiwara test benchmark (Int. Symp. Circuits and Systems, June 1985). Experimental results are presented.Keywords
This publication has 8 references indexed in Scilit:
- A framework for evaluating test pattern generation strategiesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- SOCRATES: a highly efficient automatic test pattern generation systemIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- On the Acceleration of Test Generation AlgorithmsIEEE Transactions on Computers, 1983
- The Complexity of Fault Detection Problems for Combinational Logic CircuitsIEEE Transactions on Computers, 1982
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- The complexity of theorem-proving proceduresPublished by Association for Computing Machinery (ACM) ,1971
- Analyzing Errors with the Boolean DifferenceIEEE Transactions on Computers, 1968
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966