A framework for evaluating test pattern generation strategies

Publisher Website

7 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 44-47
https://doi.org/10.1109/iccd.1989.63325

Abstract

No abstract available

Keywords

This publication has 7 references indexed in Scilit:

Efficient generation of test patterns using Boolean difference
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
SOCRATES: a highly efficient automatic test pattern generation system
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
On the Acceleration of Test Generation Algorithms
IEEE Transactions on Computers, 1983
An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
IEEE Transactions on Computers, 1981
The complexity of theorem-proving procedures
Published by Association for Computing Machinery (ACM) ,1971
Analyzing Errors with the Boolean Difference
IEEE Transactions on Computers, 1968
Diagnosis of Automata Failures: A Calculus and a Method
IBM Journal of Research and Development, 1966