Use of analog integration in dynamic background subtraction for quantitative auger electron spectroscopy: Study of CO on Mo(110)
- 31 December 1974
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 46 (2) , 672-675
- https://doi.org/10.1016/0039-6028(74)90332-x
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Corrections of auger electron signal strengths for modulation amplitude distortion in a 4-grid retarding potential energy analyzerSurface Science, 1974
- Dynamic background subtraction and the retrieval of threshold signalsReview of Scientific Instruments, 1974
- The effect of modulation amplitude on electron-excited auger data from titaniumSurface Science, 1974
- Quantitative comparison of Ti and TiO surfaces using Auger electron and soft x-ray appearance potential spectroscopiesJournal of Vacuum Science and Technology, 1974
- Quantitative Auger analysis using integration techniquesPhysics Letters A, 1973
- Distortion of Differentiated Deflection Analyzer CurrentJournal of Vacuum Science and Technology, 1972
- HIGH SENSITIVITY AUGER ELECTRON SPECTROMETERApplied Physics Letters, 1969
- Estimates of the Efficiencies of Production and Detection of Electron-Excited Auger EmissionJournal of Applied Physics, 1969
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968