Luminescence and X-ray diffraction studies of Ge nanocrystals in amorphous silicon oxide
- 30 June 2000
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 286 (1) , 161-164
- https://doi.org/10.1016/s0921-5093(00)00629-8
Abstract
No abstract availableKeywords
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