Comparison of glancing angle EXAFS extracted from reflectivity and fluorescence modes
- 1 June 1989
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 158 (1-3) , 322-323
- https://doi.org/10.1016/0921-4526(89)90297-4
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Glancing-angle extended x-ray-absorption fine structure and reflectivity studies of interfacial regionsPhysical Review B, 1988
- EXAFS studies on superficial regions by means of total reflectionPhysica Status Solidi (a), 1980