Pure optical contrast in scattering‐type scanning near‐field microscopy
- 1 April 2001
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 202 (1) , 77-83
- https://doi.org/10.1046/j.1365-2818.2001.00794.x
Abstract
We have enhanced the apertureless scattering‐type scanning near‐field optical microscope by two improvements which together achieve a recording of the true near field without any height‐induced artef...Keywords
This publication has 24 references indexed in Scilit:
- Complex Optical Constants on a Subwavelength ScalePhysical Review Letters, 2000
- Enhanced dielectric contrast in scattering-type scanning near-field optical microscopyOptics Communications, 2000
- Enhanced sensitivity near-field scanning optical microscopy at high spatial resolutionApplied Physics Letters, 1998
- Theoretical treatment for scattering scanning near-field optical microscopyJournal of the Optical Society of America A, 1997
- Contrast of microwave near-field microscopyApplied Physics Letters, 1997
- Material contrast in scanning near-field optical microscopy at 1–10 nm resolutionPhysical Review B, 1997
- Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600Optics Letters, 1996
- Scanning electromagnetic transmission line microscope with sub-wavelength resolutionOptics Communications, 1989
- Surface-enhanced optical microscopyJournal of the Optical Society of America B, 1985
- Super-resolution Aperture Scanning MicroscopeNature, 1972