Structural and Electrical Characterization of Processable Bis-Silylated Thiophene Oligomers
- 28 October 1998
- journal article
- research article
- Published by American Chemical Society (ACS) in Chemistry of Materials
- Vol. 10 (11) , 3683-3689
- https://doi.org/10.1021/cm9804261
Abstract
No abstract availableKeywords
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