X-ray microfluorescence analyzer for multilayer metal films
- 1 December 1988
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 166, 263-272
- https://doi.org/10.1016/0040-6090(88)90387-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Quantitative X‐ray fluorescence analysis of thin films using LAMA‐2X-Ray Spectrometry, 1981
- Fast Simultaneous Thickness Measurements of Gold and Nickel Layers on Copper SubstratesBell System Technical Journal, 1979
- Standardless Thickness Measurement of Steel Coatings by X-Ray Fluorescence SpectrometryPublished by Springer Nature ,1978
- Die sekundäranregung bei der Röntgenfluoreszenzanalyse ebener dünner schichtenSpectrochimica Acta Part B: Atomic Spectroscopy, 1971