The usefulness of a 400 kV high-resolution analytical electron microscope
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 18 (1-4) , 117-123
- https://doi.org/10.1016/0304-3991(85)90128-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A 400 kV High Resolution-Analytical Electron Microscope Newly ConstructedJapanese Journal of Applied Physics, 1984
- Sialons and related nitrogen ceramicsJournal of Materials Science, 1976
- Plural Scattering of 20-kev Electrons in AluminumPhysical Review B, 1962