Background errors in X-ray diffraction parameters
- 1 October 1966
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 17 (10) , 1319-1328
- https://doi.org/10.1088/0508-3443/17/10/310
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- X-ray diffraction profiles from deformed metalsBritish Journal of Applied Physics, 1965
- Temperature Diffuse Scattering of X-Rays in Cubic Powders. II. Corrections to Integrated Intensity MeasurementsJournal of Applied Physics, 1959
- Temperature Diffuse Scattering of X-Rays in Cubic Powders. I. Comparison of Theory with ExperimentJournal of Applied Physics, 1959
- Counter diffractometer - The theory of the use of centroids of diffraction profiles for high accuracy in the measurement of diffraction anglesBritish Journal of Applied Physics, 1959
- The use of Fourier analysis in the interpretation of X-ray line broadening from cold-worked iron and molybdenumActa Crystallographica, 1954
- The Diffraction of X-Rays by Distorted-Crystal Aggregates III: Remarks on the Interpretation of the Fourier CoefficientsProceedings of the Physical Society. Section B, 1952