Counter diffractometer - The theory of the use of centroids of diffraction profiles for high accuracy in the measurement of diffraction angles
- 1 February 1959
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 10 (2) , 57-68
- https://doi.org/10.1088/0508-3443/10/2/301
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Effect of Lorentz Factor and Dispersion on Measurement of Lattice Parameters with Powder CamerasProceedings of the Physical Society, 1958
- Lattice parameter determination from broad diffraction linesJournal of Scientific Instruments, 1958
- Counter diffractometer - the effect of vertical divergence on the displacement and breadth of powder diffraction linesJournal of Scientific Instruments, 1957
- Use of Counter Tubes in X-Ray AnalysisReview of Scientific Instruments, 1956
- Effect of Dispersion and Geometric Intensity Factors on X-Ray Back-Reflection Line ProfilesJournal of Applied Physics, 1956
- A monitored Geiger-counter X-ray powder diffractometer with automatic recordingJournal of Scientific Instruments, 1956
- Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction MaximaJournal of Scientific Instruments, 1950
- On the correction of lattice spacings for refractionMathematical Proceedings of the Cambridge Philosophical Society, 1940