Lattice parameter determination from broad diffraction lines
- 1 January 1958
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 35 (1) , 34-35
- https://doi.org/10.1088/0950-7671/35/1/116
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Counter diffractometer - the effect of vertical divergence on the displacement and breadth of powder diffraction linesJournal of Scientific Instruments, 1957
- Effect of Dispersion and Geometric Intensity Factors on X-Ray Back-Reflection Line ProfilesJournal of Applied Physics, 1956
- Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction MaximaJournal of Scientific Instruments, 1950
- On the correction of lattice spacings for refractionMathematical Proceedings of the Cambridge Philosophical Society, 1940
- An X-Ray Study of the Changes that Occur in Malleable Iron During the Process of FatiguingPhysical Review B, 1939