Flight quality nickel-chromium films with sheet resistances up to 420 ohms per square
- 1 February 1975
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 14 (1) , 41-48
- https://doi.org/10.1016/0026-2714(75)90460-6
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Electrical and structural properties of NiCr thin film resistors reactively sputtered in O2Thin Solid Films, 1974
- Nickel-chromium resistor failure modes and their identificationMicroelectronics Reliability, 1973