Electrical and structural properties of NiCr thin film resistors reactively sputtered in O2
- 1 February 1974
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 20 (2) , 345-362
- https://doi.org/10.1016/0040-6090(74)90070-4
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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