Magnetic bubble device testing
- 1 September 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 13 (5) , 1364-1369
- https://doi.org/10.1109/tmag.1977.1059603
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- High performance magnetic bubble replicate gate designIEEE Transactions on Magnetics, 1977
- 68 kbit capacity 16 µm-period magnetic bubble memory chip design with 2 µm minimum featuresIEEE Transactions on Magnetics, 1976
- Magnetic bubble dual-in-line package (DIP) functional and reliability testingIEEE Transactions on Magnetics, 1976
- Long-term testing of 68 kbit bubble device chipsIEEE Transactions on Magnetics, 1976
- Bubble memory design and performanceIEEE Transactions on Magnetics, 1976